HOME > HARDWARE > Microwave Dielectric Measurement System > Resonant Cavity Type Microwave Dielectormeter
![]() A system component used |
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A system component used |
![]() A resonant cavity |
![]() 2 - 10GHz resonant cavity |
Features
Specification(Provisional Figures)
| Frequency | 2GHz to 18GHz |
|---|---|
| Frequency Point | 1 point per a resonator |
| Measuring range | ε: 1-30 tanδ: 0.0001-0.1 |
| Measurement Accuracy | ε: ±1% tanδ: ±5% |
| Sample shape | a strip, a round bar, a square bar or a thin film |
The resonant cavity type microwave dielectrometer is the system which measures dielectric properties at microwave frequencies. This system has 2 types, which use either a synthesized sweep oscillator (an alternative to a network analyzer) or a network analyzer.
The synthesized sweep oscillator type consists of an oscillator, which includes a microwave signal generator and a detector, a measurement cavity, a customized software, and accessories. This is a low cost type because it does not have expensive measurement devices. The network analyzer type sets up with your network analyzer to use. It consists of a measurement cavity, a customized software, and accessories.
The resonant cavity type microwave dielectrometer has highly accurate measurement software. By simply inserting a material into the slot of the cavity, and following an easy step-by-step operation of the software wizard, the measurement is achieved complex dielectric properties very accurately and very simply.
(*Please see the movie titled "4.Actual Measurement" on the top page.)
The tool to measure is a resonant cavity which has single-frequency point per a resonator. It is suitable to measure for thin films, multilayer structure materials, ceramics, liquid, various resin and powder. The measurement method was established by JIS(Japanese Industrial Standards) C 2565.
The random error of the epsilon is estimated to be less than 1%, and the error of the tangent delta is less than 5%.
The measurement method by the resonant cavity is destructive measurement. The dimension of the sample to be tested should be larger than 80mm(L) x less than 3mm(W). Thickness is 0.05mm - 1mm.
This system can measure relative dielectric constants from 1 to 30, and the loss tangent from 0.0001 to 0.1.
Yes. Please send your sample materials. We will send you the measurement results.
contact:info@aetjapan.com