Microwave Dielectric Measurement System
(Microwave Dielectrometer)

Synthesized sweep oscillator type

Microwave Dielectric Measurement System (Microwave Dielectrometer) developed by AET, Inc. enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.　A built-in feedback oscillator circuit enables accurate measurements with an easy step-by-step operation. Accuracy is achieved by combining a high Q cavity, a highly accurate measurement algorithm and the 3D electromagnetic simulation software.

PATENT No.3691812

2 types of system components

Microwave Dielectrometer has two types, which use either a synthesized sweep oscillator (an alternative to a network analyzer) or a network analyzer.

• Synthesized sweep oscillator type (AET original device)
  The oscillator type consists of an oscillator, which includes a microwave signal generator, a detector, a measurement probe, a customized software, and accessories. This is a low cost type because it does not have expensive measurement devices.

  (* It doesn't include a PC.)

• Network analyzer type
  The network analyzer type sets up with your network analyzer to use. It consists of a measurement probe, a customized software, and accessories.

  (* It doesn't include a PC.)

2 types of measurement tools

• Open coaxial probe
• Resonant cavity

Applications

• Substrate materials for high-speed digital and microwave circuits
• New materials
• Semiconductor materials
• Thin film materials

Open Coaxial Resonator Type Microwave Dielectrometer 
(PATENT No.3691812)

Network analyzer type

Coaxial probe and sample setting

Resonant Cavity Type Microwave Dielectrometer
JIS(Japanese Industrial Standards) C 2565

Oscillator type

Cavity and sample setting

Easy operation software for anyone to use

This measurement software was developed for high precision measurements with easy step-by-step operation.
Simply placing a sample on the probe, and clicking the buttons by following the software wizard, the values of epsilon and tangent delta are calculated.

STEP 1
Main Menu

Start the software program.
Choose the specific frequency.

STEP 2
Calibration

Calibrations are required for the first-time measurement. Measure the value of air (εr=1) and 2 reference materials.

STEP 3
Actual measurement

Place the actual material on the probe.　　 After the measurement is completed, the values of epsilon and tangent delta are displayed. Save the results in a CSV file.
＊For a repeat measurement, the measurement procedures for air and reference materials can be skipped.

How to use software
Please see the movie titled "4.Actual Measurement".
PDF →

Dielectric Measuring Service

AET Inc. offers the dielectric measurement service. If you send your sample to us, we select the most suitable measurement method according to the size and the shape of a sample material, and provide the measurement for almost all forms of samples including solid, sheet, film, multi-layered circuit board, particle and liquid.

Please refer the following page.
[ Service>> Dielectric Measurement Service ]

A breakthrough in Measurement Techniques

Microwave Dielectrometer was developed by the new measurement techniques which integrated the RF technique and the electromagnetic-field simulation technique.

Simulation using MW STUDIO

Electric field distribution near the measuring point

Coaxial resonator

When a sample material is placed on the probe, the evanescent electrical field leaks from the probe tip into the sample material. This electrical field changes with the dielectric properties of the material, which in turn changes the resonant frequency and the Q factor of the whole cavity. The dielectric properties are then calculated from the changed resonance. The highly accurate measurement algorithm to compute the complex permittivity, uses the electromagnetic-field distribution and resonant characteristics of the evanescent mode computed by the 3D EM-field simulator, "MW STUDIO".