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Magnetic Field Probe

The magnetic field probe performs non-contact current measurements and can be used for real traces. The probe of higher resolution enables pinpoint measurements.

We provide three types of probes, AEMP001, CP-2S, and MP-10L, as well as the extension module for AEMP001.

Magnetic Field Probe

AEMP001 (AET, Inc.)

Specifications
Measurement Frequency 10MHz - 18GHz
Spatial Resolution 0.50mm
Connector SMA Female
Detector Size 2.5mm - 0.7mm
Attachment Specifications 4EM200, 4EM500
DUTs
  • Boards with high speed digital devices
    (high speed FPGA, DSP, CPU)
  • High speed digital communication boards
    (PCI Express 2.0, USB3.0, HDMI1.3, etc.)
  • Microwave circuit boards and components

CP-2S (NEC Engineering, Ltd.)

Specifications
Measurement Frequency 10MHz - 3GHz
Spatial Resolution Approx. 0.25mm
Detector Size 2mm × 1mm
DUTs
  • Pins of LSI package
  • Module level
  • PCB circuits, etc.
    DUT L⁄S=0.1 mm ⁄ 0.3 mm
    * IEC Standard (IEC61967-6) Compliant

MP-10L (NEC Engineering, Ltd.)

Specifications
Measurement Frequency 150kHz - 1GHz
Spatial Resolution Approx. 1.0mm
Detector Size 12mm × 3mm
DUTs
  • LSI power supply wiring
  • VCCI kit module interference wave measurement
  • Power supply wiring, etc.
    DUT L⁄S=0.1 mm ⁄ 2.0 mm
    * IEC Standard (IEC61967-6) Compliant

Frequency Extension Kit (for AEMP001)

Measurement Frequency Expansion Kit
* AET, Inc is a member of Agilent Technologies Solution Partner program.

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