Magnetic Field Probe
The magnetic field probe performs non-contact current measurements and can be used for real traces. The probe of higher resolution enables pinpoint measurements.
We provide three types of probes, AEMP001, CP-2S, and MP-10L, as well as the extension module for AEMP001.

AEMP001 (AET, Inc.)
Specifications
| Measurement Frequency |
10MHz - 18GHz |
| Spatial Resolution |
0.50mm |
| Connector |
SMA Female |
| Detector Size |
2.5mm - 0.7mm |
| Attachment Specifications |
4EM200, 4EM500 |
| DUTs |
- Boards with high speed digital devices
(high speed FPGA, DSP, CPU)
- High speed digital communication boards
(PCI Express 2.0, USB3.0, HDMI1.3, etc.)
- Microwave circuit boards and components
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CP-2S (NEC Engineering, Ltd.)
Specifications
| Measurement Frequency |
10MHz - 3GHz |
| Spatial Resolution |
Approx. 0.25mm |
| Detector Size |
2mm × 1mm |
| DUTs |
- Pins of LSI package
- Module level
- PCB circuits, etc.
DUT L⁄S=0.1 mm ⁄ 0.3 mm * IEC Standard (IEC61967-6) Compliant
|
MP-10L (NEC Engineering, Ltd.)
Specifications
| Measurement Frequency |
150kHz - 1GHz |
| Spatial Resolution |
Approx. 1.0mm |
| Detector Size |
12mm × 3mm |
| DUTs |
- LSI power supply wiring
- VCCI kit module interference wave measurement
- Power supply wiring, etc.
DUT L⁄S=0.1 mm ⁄ 2.0 mm * IEC Standard (IEC61967-6) Compliant
|
Frequency Extension Kit (for AEMP001)

* AET, Inc is a member of Agilent Technologies Solution Partner program.