Resonant Cavity Type Microwave Dielectrometer
Resonant Cavity Type Microwave Dielectrometer calculates dielectric properties from resonance changes in the resonant cavity. By just inserting a sample material in the cavity and following the multi-step wizard of the software, one can easily obtain desired quantities.
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| A sample setting of a resonant cavity for a flat panel (JIS-compliant 1641) |
A sample setting of 2-10GHz resonant cavity (JIS-compliant C2565) |
Features
- Fast and accurate
- Easy to operate
- Stable
System components
There are two types of components: oscillator type and network analyzer type. The oscillator includes a microwave signal generator and a detecter, and serves as a substitute network, thereby eliminating the need of a costly network analyzer. The network analyzer type should be used with a network analyzer of your own.
Oscillator type consists of:
an oscillator, a measurement cavity, a customized software, and accessories.
(PC is not included) |
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Network analyzer type consists of:
a measurement cavity, a customized software, and accessories.
(Neither PC nor network analyzer is included) |
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Specifications
(Provisional Figures)
| Frequency range |
1 - 18GHz |
| Frequency point |
1 frequency point per a resonator |
| Measurement range |
ε: 1 - 30 tanδ: 0.0001 - 0.1 |
| Max. measurement error |
ε:±1% tanδ: ±5% |
| Sample Shape |
strip, square bar, thin film |
FAQ
General
Materials to be tested
System Option
General
The resonant cavity type microwave dielectrometer is the system which measures dielectric properties at microwave frequencies. This system has 2 types, which use either a synthesized sweep oscillator (an alternative to a network analyzer) or a network analyzer.
The synthesized sweep oscillator type consists of an oscillator, which includes a microwave signal generator and a detector, a measurement cavity, a customized software, and accessories. This is a low cost type because it does not have expensive measurement devices. The network analyzer type sets up with your network analyzer to use. It consists of a measurement cavity, a customized software, and accessories.
The measurement is based on the resonant-perturbation method.
The resonant characteristic of the cavity, the resonant frequency and the
quality factor will be changed when the material is inserted into the
cavity. The complex permittivity can be calculated by the change of
the resonance frequency and Q factor.
The resonant cavity type microwave dielectrometer has highly accurate measurement software. By simply inserting a material into the slot of the cavity, and following an easy step-by-step operation of the software wizard, the measurement is achieved for complex dielectric properties very accurately and very simply.
( *Please see the movie titled "4.Actual Measurement" on the top page. )
The tool to measure is a resonant cavity which has single-frequency point per a resonator. It is suitable to measure for thin films, multilayer structure materials, ceramics, liquid, various resin and powder. The measurement method was established by JIS (Japanese Industrial Standards) C 2565.
The random error of the epsilon is estimated to be less than 1%, and the error of the tangent delta is less than 5%.
Materials to be tested
The measurement method by the resonant cavity is destructive measurement. The dimension of the sample to be tested should be larger than 80mm (L) × less than 3mm(W). Thickness is 0.05mm - 1mm.
This system can measure relative dielectric constants from 1 to 30, and the loss tangent from 0.0001 to 0.1.
Yes. Please send your sample materials. We will send you the measurement results.
contact:info@aetjapan.com
System Option
Agilent technology PNA series, ENA series, 872x series, ANRITSU 37000
and Rohde & Schwarz network analyzers. If you have any other network
analyzers, please contact us.
contact:info@aetjapan.com
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