Microwave Dielectric Measurement System

• Microwave Dielectrometer
• Open Coaxial Resonator Type Microwave Dielectrometer
• Resonant Cavity Type Microwave Dielectrometer
• Dielectric Resonator Type Microwave Dielectrometer

EMI Near-Field Measurement

• Magnetic Field Probe

Probe Station

• Probe Station System
• 3-Dimensional Probe Station System
• Double-sided PCB Probe Station
• Micropositioner

Electron Guns / Ion Sources

• Electron Gun
• Dispenser Cathodes
• LaB6 Cathodes
• Ion Sources
• High Temperature Substrate Heater

High Voltage Pulse Devices

• High Voltage Short Pulse Generator
• High Voltage Pulse Power Supplies
• High Power Pulse Transformers
• Pulse Current Transformers, Capacitance Type Pulse Voltage Dividers
• Power Supplies for Capacitor Charging
• High Voltage Cable Termination, Feed-Through Bushing

Accelerator

• Compact Linear Accelerator
• RF Gun

X-ray Source

• Miniature X-ray Source
• Micro Miniature X-ray Source
• Dose Calibrators

Microwave Heating and Drying System

• Microwave Heating and Drying System

Microwave Components

• RF Microwave Vacuum Window
• Synthesizers
• Ultra-broadband Solid State Power Amplifier
• High Performance Microwave Cables
• High-Power RF Connectors
• Precision Adapters
• Waveguides
• Wave absorbers, Shielded materials
• High-power Circulators, Isolators, Dummy Loads
• Magnetrons

Microwave Plasma System

• Microwave High Power Sources
• Plasma Components
• Microwave Applicator

Microwave Power Sources

• Microwave High Power Sources
• Klystron Microwave Generators

Microwave Dielectric Measurement System (Microwave Dielectrometer) developed by AET, Inc. enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. The measurement accuracy is ensured by AET's experiences with designing resonators of high Q-factor as well as the 3D numerical electromagnetic calculation.

• Accurate
• Easy to operate
• No necessity of network analyzer

Currently three measurement methods are provided, and each one has its own feature.

(PATENT No.3691812)

Non-destructive measurement is possible with open coaxial resonator. > Details      > Faq

Skip to top

(JIS C2565 compliant)

Optimum method for thin films and PCBs. > Details      > Faq

Skip to top

(JIS R1627 compliant, IEC 61338-1-3 compliant)

Dedicated method for low loss ceramics. > Details

Skip to top