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Dielectric Measurement Service

 

.Until now, measurements of the dielectric properties depend on the approximate calculations that are based on the perturbation theory. The dielectric measurement service offered by AET, Inc. uses a high Q cavity and 3D electromagnetic field simulation technique into the process of measuring the dielectric properties. This allows us to accurately compute the complex value of relative dielectric properties of a sample.
We select the most suitable measurement method according to the size and shape of a sample material, and provide the measurement for almost all forms of samples including solid, sheet, film, multi-layered circuit board, particle and liquid.

 


Measurement by a resonant chamber

 

Applications:

  • Substrate materials for high-speed digital and microwave circuits

  • Low loss dielectrics used for filters and dielectric antenna

  • Thin film materials

  • Semiconductor materials

  • Medical Electronics
  • Chemicals

  • Foods(moisture content)

  • Body tissues

  • Gases

  • Liquids

Measuring Methods

Measuring Methods

Material shapes

Materials

Frequency

Features

Open Coaxial Resonator

Free

Solid, Liquid

800MHz -
18GHz

Non-destructive measurement of the permittivity of thin-films in microwave range.

Resonant Cavity
[JIS C2565]

Small-size Cylinder / Prism, Thin Film

Solid, Liquid, Particle

1GHz - 50GHz

Accurate but destructive measurement in the microwave and millimeter wave range.

Stripline Resonator

Plate, Thin Film

Solid

1GHz - 18GHz

Measurement of the material of a printed circuit board while in use.
Coaxial Reflection Free Liquid, etc. 200MHz - 40GHz Measurement of continuous dielectric properties in broad band.
Capacitance Plate Solid 10MHz - 1GHz Measurement of continuous dielectric properties.

Highly Accurate Simulation by MW STUDIO

Highly Accurate Simulation by MW STUDIO

Microwave Dielectric Measurement System (Microwave Dielectrometer)

AET provides self-developed microwave dielectric measurement system (Microwave Dielectrometer).
It enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. It has two types of measurement tools, which are the open coaxial probe type and the resonant cavity type.

Please refer the following page.
Hardware > Microwave Dielectric Measurement System

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