Dielectric Measurement Service
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.Until now, measurements of the dielectric properties depend on the approximate calculations that are based on the perturbation theory. The dielectric measurement service offered by AET, Inc. uses a high Q cavity and 3D electromagnetic field simulation technique into the process of measuring the dielectric properties. This allows us to accurately compute the complex value of relative dielectric properties of a sample. |
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Applications:
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Measuring Methods
Measuring Methods | Material shapes | Materials |
Frequency |
Features |
|---|---|---|---|---|
Open Coaxial Resonator | Free | Solid, Liquid |
800MHz - |
Non-destructive measurement of the permittivity of thin-films in microwave range. |
Resonant Cavity | Small-size Cylinder / Prism, Thin Film | Solid, Liquid, Particle |
1GHz - 50GHz |
Accurate but destructive measurement in the microwave and millimeter wave range. |
Stripline Resonator |
Plate, Thin Film |
Solid |
1GHz - 18GHz |
Measurement of the material of a printed circuit board while in use. |
| Coaxial Reflection | Free | Liquid, etc. | 200MHz - 40GHz | Measurement of continuous dielectric properties in broad band. |
| Capacitance | Plate | Solid | 10MHz - 1GHz | Measurement of continuous dielectric properties. |
Highly Accurate Simulation by MW STUDIO
Microwave Dielectric Measurement System (Microwave Dielectrometer)
AET provides self-developed microwave dielectric measurement system (Microwave Dielectrometer).
It enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. It has two types of measurement tools, which are the open coaxial probe type and the resonant cavity type.
Please refer the following page.
Hardware > Microwave Dielectric Measurement System



