Open Coaxial Resonator Type Microwave Dielectrometer

PATENT No.3691812

Open Coaxial Resonator Type Microwave Dielectrometer makes accurate measurement possible using an evanescent mode of an open coaxial resonator, which acts as a measurement probe.

When a sample material is placed on the probe, the evanescent electrical field leaks from the probe tip into the sample material. This electrical field changes with the dielectric properties of the material, which in turn changes the resonant frequency and the Q-factor of the whole cavity. The dielectric properties are then calculated from the changed resonance. The highly accurate measurement algorithm to compute the complex permittivity, uses the electromagnetic-field distribution and resonant characteristics of the evanescent mode computed by the 3D EM-field simulator, "CST MICROWAVE STUDIO".

Electric field distribution near the measuring point
Electric field distribution near the measuring point
Coaxial resonator
Coaxial resonator

The technical article regarding the measurement principle of this system was presented in the IEEE Microwave Theory and Techniques.

R. Inoue, et al., "Data Analysis of the Extraction of Dielectric Properties From Insulating Substrates Utilizing the Evanescent Perturbation Method ", IEEE Trans. Microwave Theory Tech., vol. 54,no. 2, pp. 522-532, Feb. 2006.

Specifications

(Provisional Figures)

Frequency range 0.8 - 18GHz
Frequency point 5 discrete frequency points
Measurement range ε: 1-15   tanδ: 0.001-0.1
Max. measurement error ε: ±1%    tanδ: ±5%
Sample Shape Arbitrary shape with at least one flat surface.
10mm × 10mm × 0.5mm or the larger.

FAQ

General

Q1. What is the open coaxial resonator type microwave dielectrometer ?

Q2. What are the system components of the synthesized sweep oscillator type and the network analyzer type?

Q3. What is the difference between this system and the conventional system?

Q4. What is the difference between this system and the conventional system?

Q5. What is the measurement principle using this probe?

Q6. How good is the accuracy and what is important for accurate measurements?

Materials to be tested

Q1. What are the requirements for the sample material?

Q2. What are the limitations of the dielectric properties?

Q3. What is the reason of the limitation of the properties?

Q4. Is it possible to measure anisotropic materials?

Q5. Is it possible to try sample measurements?

System Option

Q1. What are the reference materials?

Q2. Which network analyzers can be used for the microwave dielectrometer?

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