Dielectric Measurement Service
Now that high-speed and broadband is becoming ever more widespread, intense demand rises for high-efficiency materials. To meet the demand, it's pivotal to analyze characteristics of materials, especially to perform dielectric measurements. AET, Inc. with our experience and expertise in the fields of microwave and millimeter-wave, provides you with services for dielectric measurements.
The dielectric measurement service offered by AET, Inc. uses a high Q cavity and 3D electromagnetic field simulation technique into the process of measuring the dielectric properties. This allows us to accurately compute the complex value of relative dielectric properties of a sample.
For each sample material, the most suitable measurement method will be selected according to its size and shape. Almost all forms of samples are measurale, e.g. solid, sheet, film, multi-lavered circuit board, particle and liquid.
- Substrate materials for high-speed digital and microwave circuits
- Low loss dielectrics used for filters and dielectric antenna
- Thin film materials, Multilayered structure materials, New materials
- Semiconductor materials
- Medical Electronics
|Solid||Strip||1～10GHz||Accurate measurement in the microwave range.|
(Compliant standard: JIS C2565, ASTM D2520, IEC60556)
|Thin film||10～40GHz||The gap for inserting the measurement sample is fixed, and the measurement stability is superior to the pinching method.|
(Compliant standard: JIS R1641, IPC-TM650 184.108.40.206, IEC62562)
|thickness:> 0.5mm||0.8～18.4GHz||Non-destructive measurement of the permittivity of samples with a flat surface. |
(PATENT No. 3691812)
|Open Coaxial Resonator|
|Plate||10MHz～1GHz||Broad band and continued measurement frequency range; 10MHz～1GHz.|
|1～10GHz||The high-precision measurement is realized by the resonator of dedicated design.|
The filling factor of powder is calculated from the true density information and the dielectric constant of the powder itself is calculated.
|Liquid etc.||30cc||200MHz～10GHz||Broad band and continued measurement frequency range; 200MHz～10GHz.|
|Cable||Cable||2.45～15GHz||Low-delay and low-loss wire materials, such as foamed PTFE, in product form can be measured with high accuracy.|
|High dielectric material with low loss||Cylinder||～20GHz||Measurement of low loss dielectric materials with tanδof 0.001 or less. (Compliant standard: JIS R1627, IEC 61338-1-3)|
Microwave Dielectric Measurement System(Microwave Dielectrometer)
AET provides self-developed microwave dielectric measurement system (Microwave Dielectrometer).
It enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. Two types are available for measurement tools: open coaxial probe type and resonant cavity type.
Please refer to the following page.
Hardware > Microwave Dielectric Measurement System