Microwave Dielectrometer
Measurement innovation with smart design
The dielectric properties are the essential parameters for the design of wireless and high-speed digital devices.In order to meet the growing demand for fast and accurate measurements, AET offers a highly precise dielectric measurement system for various samples easily, accurately with reasonable cost.
Choose from measurement frequencies
TM mode CavityResonator | ||||
TE mode Cavity Resonator | ||||
Open Coaxial Resonator | ||||
1 |
5 |
10 ( GHz ) |
18 |
40 |
---|
Choose from materials
Film, Substrate
|
TM mode Cavity ResonatorVersatile method for stripe shape samples |
|
---|---|---|
Glass, Ceramics |
TE mode Cavity ResonatorOptimized for films samples Up to 40GHz |
|
Powder, Cable, etc. |
||
Plastics, Molding |
Open Coaxial ResonatorNon-destructive method for arbitrary shape samples |
Features
- Accurate
- Easy to operate
- No necessity of network analyzer
Currently three measurement methods are provided, and each one has its own feature.
System ConfigurationNetwork Analyzers
The dielectric measurement system consists of, 1. Resonator 2. Vector Network Analyzer (VNA), and 3. Windows PC.
1. Resonator
2. Vector Network Analyzer
3. Windows PC
*PC not included