Microwave Dielectrometer

Microwave Dielectric Measurement System (Microwave Dielectrometer) developed by AET, Inc. enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. The measurement accuracy is ensured by AET's experiences with designing resonators of high Q-factor as well as the 3D numerical electromagnetic calculation.

Warning: include(./pickup/dielec.php): failed to open stream: No such file or directory in /home/aetjapan/aetjapan.com/public_html/home/hardware/details.php on line 144

Warning: include(): Failed opening './pickup/dielec.php' for inclusion (include_path='.:/opt/php-7.2.27/data/pear') in /home/aetjapan/aetjapan.com/public_html/home/hardware/details.php on line 144


  • Accurate
  • Easy to operate
  • No necessity of network analyzer

Currently three measurement methods are provided, and each one has its own feature.

Open Coaxial Resonator Type Microwave Dielectrometer

(PATENT No.3691812)

Non-destructive measurement is possible with open coaxial resonator.
Details      Faq
Coaxial probe and sample setting

Resonant Cavity Type Microwave Dielectrometer

(JIS C2565 compliant)

Optimum method for thin films and PCBs.
Details      Faq

Dielectric Resonator Type Microwave Dielectrometer

(JIS R1627 compliant, IEC 61338-1-3 compliant)

Dedicated method for low loss ceramics.

Related product