Microwave Dielectric Measurement System (Microwave Dielectrometer) developed by AET, Inc. enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials. The measurement accuracy is ensured by AET's experiences with designing resonators of high Q-factor as well as the 3D numerical electromagnetic calculation.
- Easy to operate
- No necessity of network analyzer
Currently three measurement methods are provided, and each one has its own feature.
Open Coaxial Resonator Type Microwave Dielectrometer
Resonant Cavity Type Microwave Dielectrometer
(JIS C2565 compliant)
Dielectric Resonator Type Microwave Dielectrometer
(JIS R1627 compliant, IEC 61338-1-3 compliant)