Open Coaxial Resonator

For samples having one flat surface, non-destructive dielectric measurement can be performed simply by placing it on the resonator.
This revolutionary measurement method is achieved by the unique technology using a near field called an evanescent wave.

Since no sample processing is required before measurement, measurement can be performed easily.


Suitable for measuring the following samples.
  • Smart Phone case
  • Molding plastics
  • etc.


Frequency range
(5 discrete frequency points / resonator )
Type A0.8 / 2.45 / 4.2 / 5.8 / 7.6GHz
Type B1 / 3.1 / 5.2 / 7.3 / 9.4GHz
Type C2 / 6.1 / 10.2 / 14.3 / 18.4GHz
Measurement range εr(Dk):1 - 15 tanδ(Df):0.1 - 0.001
Measurement accuracy εr(Dk):±1% tanδ(Df):±5%
Sample shape Arbitrary shape with at least one flat surface.
10mm x 10mm x 0.5mm or larger

This device was developed in cooperation with Maeda Laboratory of Graduate School of The University of Tokyo. PATENT No. 3691812

Measurement using evanescent wave

The near field called the evanescent wave leaking from the small opening of the open coaxial resonator penetrates in the measurement sample, and the resonance characteristics change depending on the dielectric properties of the sample.

This resonator measures the dielectric properties at a local area near the surface of the measurement sample.
The measurement target must be of uniform composition. If the layered materials or composite materials such as printed circuit boards are measured, the results will be influenced by the material properties at the surface of the sample.

Simple operation by Easy-to-use Software

AET’s measurement software is designed to use intuitively without any expert knowledge about dielectric measurements or microwave electronics.



Q1. What is the open coaxial resonator type microwave dielectrometer ?

Q2. What are the system components of the synthesized sweep oscillator type and the network analyzer type?

Q3. What is the difference between this system and the conventional system?

Q4. What is the difference between this system and the conventional system?

Q5. What is the measurement principle using this probe?

Q6. How good is the accuracy and what is important for accurate measurements?

Materials to be tested

Q1. What are the requirements for the sample material?

Q2. What are the limitations of the dielectric properties?

Q3. What is the reason of the limitation of the properties?

Q4. Is it possible to measure anisotropic materials?

Q5. Is it possible to try sample measurements?

System Option

Q1. What are the reference materials?

Q2. Which network analyzers can be used for the microwave dielectrometer?