Open Coaxial Resonator
For samples having one flat surface, non-destructive dielectric measurement can be performed simply by placing it on the resonator.
This revolutionary measurement method is achieved by the unique technology using a near field called an evanescent wave.
Since no sample processing is required before measurement, measurement can be performed easily.
UseSuitable for measuring the following samples.
- Smart Phone case
- Molding plastics
(5 discrete frequency points / resonator )
|Type A||0.8 / 2.45 / 4.2 / 5.8 / 7.6GHz|
|Type B||1 / 3.1 / 5.2 / 7.3 / 9.4GHz|
|Type C||2 / 6.1 / 10.2 / 14.3 / 18.4GHz|
|Measurement range||εr(Dk)：1 - 15 tanδ(Df)：0.1 - 0.001|
|Measurement accuracy||εr(Dk)：±1% tanδ(Df)：±5%|
|Sample shape||Arbitrary shape with at least one flat surface.
10mm x 10mm x 0.5mm or larger
This device was developed in cooperation with Maeda Laboratory of Graduate School of The University of Tokyo. PATENT No. 3691812
Measurement using evanescent wave
The near field called the evanescent wave leaking from the small opening of the open coaxial resonator penetrates in the measurement sample, and the resonance characteristics change depending on the dielectric properties of the sample.
This resonator measures the dielectric properties at a local area near the surface of the measurement sample.
The measurement target must be of uniform composition. If the layered materials or composite materials such as printed circuit boards are measured, the results will be influenced by the material properties at the surface of the sample.
Simple operation by Easy-to-use Software
AET’s measurement software is designed to use intuitively without any expert knowledge about dielectric measurements or microwave electronics.