TM mode Cavity Resonator

Cutting machine for film (Optional Item)

TM mode Cavity Resonator measures strip-shaped samples.
The high Q factor resonator enables the stable measurement with high resolution of low dielectric loss materials such as PTFE and high-purity ceramics.

This method is compliant with JIS C2565, ASTM D2520.


Suitable for measuring the following samples.
  • PCB substrates
  • Thin films
  • Plastics
  • Ceramics


Frequency range 1GHz - 10GHz
Frequency point 1 frequency point per a resonator
Measurement range εr(Dk):1 - 30 tanδ(Df):0.1 - 0.0001
Measurement accuracy εr(Dk):±1% tanδ(Df):±5%
Sample shape Strip, larger than 80mm (L) × 3mm (W) × 0.05mm - 1mm (T)
Compliant standard JIS C2565, ASTM D2520

Feature: TM mode Cavity Resonator

TM mode cavity resonator uses the TM resonant mode (TM010 / 011), where the electric field vector is parallel to the rotational axis of the cylindrical cavity.
By inserting the measurement sample along with the center axis of the cylinder, the resonance changes according to its dielectric constant.

Shape and size of sample

The shape of the measurement sample is a strip. The dielectric constant in the longitudinal direction of the strip is measured.

Cutting machine for film (Optional Item)

The dedicated cutting machine is available for film materials (thickness is 0.2mm or less).



Q1. What is the resonant cavity type microwave dielectrometer ?

Q2. What are the system components of the synthesized sweep oscillator type and the network analyzer type ?

Q3. What is the measurement theory of this system?

Q4. What is the difference between this system and the conventional system ?

Q5. What is the tool to measure ?

Q6. How good is the accuracy ?

Materials to be tested

Q1. What are the requirements for the sample material ?

Q2. What are the limitations of the dielectric properties ?

Q3. Is it possible to try sample measurements ?

System Option

Q1. Which network analyzers can be used for the microwave dielectrometer?